ATPG
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Automatic test pattern generation (ATPG) systems are tools for generating tests for digital circuits after they are produced.
Testing very-large-scale integrated circuits with a high fault coverage is a difficult task because of complexity. Different ATPG methods have to be applied to combinatorial and sequential circuits.
See also:
- Design for Test (DFT)
- Fault model
- ASIC
- VHSIC